O Institutu

Raziskovalni odseki
Službe in podporne dejavnosti


Center for Electron Microscopy and Microanalysis (CEMM) is JSI infrastructure unit which comprises analytical equipment for various electron microscopy techniques that are necessary for R&D work of JSI departments. Access to the CEMM equipment is also available to other research institutions and universities.

Users of CEMM research equipment are those graduate students and researchers who are interested in comprehensive structural and chemical characterization of materials on micro-, nano- and atomic scale with a number of complementary methods of electron microscopy.


Head of Center
Prof. Miran Čeh, miran.ceh@ijs.si
Phone: +386 (0)1 477 33 41, Mobile: +386 (0)41 743 265
Fax: +386 (0)1 477 32 21

The Center for Electron Microscopy and Microanalysis (CEMM) comprises three scanning electron microscopes (JEOL JXA-840A, JEOL JSM-5800, JEOL JSM-7600F), two transmission electron microscope (JEOL JEM-2100, JEOL JEM-2010F) and equipment for SEM and TEM sample preparation.

All scanning electron microscopes are equipped with EDXS and/or WDXS spectroscopy, enabling the determination of the chemical composition of the investigated materials on micro- scale. JEOL JSM-7600F is additionally equipped with electron backscattered diffraction (EBSD) and electron lithography.

Analytical transmission electron microscope JEOL JEM-2010F is equipped with a FEG electron source. The microscope is equipped with STEM unit (BF, ADF, HAADF detectors) and with EELS. Both transmission electron microscopes are equipped with EDXS and CCD cameras for image acquisition. Ion etching, FIB and tripod polishing techniques are used for TEM sample preparation.

Institut "Jožef Stefan", Jamova 39, 1000 Ljubljana, Slovenija, Telefon: (01) 477 39 00, Faks.: (01) 251 93 85