CENTER FOR ELECTRON MICROSCOPY AND MICROANALYSIS (CEMM)
Head of Center
Prof. Miran Čeh, miran.ceh@ijs.si
Phone: +386 (0)1 477 33 41, Mobile: +386 (0)41 743 265
The Center for Electron Microscopy and Microanalysis (CEMM) comprises three scanning electron microscopes (JEOL JXA-840A, JEOL JSM-5800, JEOL JSM-7600F), two transmission electron microscope (JEOL JEM-2100, JEOL JEM-2010F) and equipment for SEM and TEM sample preparation.
All scanning electron microscopes are equipped with EDXS and/or WDXS spectroscopy, enabling the determination of the chemical composition of the investigated materials on micro- scale. JEOL JSM-7600F is additionally equipped with electron backscattered diffraction (EBSD) and electron lithography.
Analytical transmission electron microscope JEOL JEM-2010F is equipped with a FEG electron source. The microscope is equipped with STEM unit (BF, ADF, HAADF detectors) and with EELS. Both transmission electron microscopes are equipped with EDXS and CCD cameras for image acquisition. Ion etching, FIB and tripod polishing techniques are used for TEM sample preparation.